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| ♦ XMICRO SOLUTION PTE LTD | |
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| XMICRO SOLUTION PTE LTD | |
 OLYMPUS – Xmicro Solution High Resolution 3D Observation and Measurement… in Real Time For fine surface profile measurement, are you really satisfied with the amount of time required for observation and measurement? With current standards of operability, measurement precision and image resolution? To meet our customers’ demands for faster performance, easier operation and greater accuracy, Olympus has developed Olympus LEXT – a new confocal laser scanning microscope for ultra-precise measurement and observation with the highest levels of reliability. No vacuum pumpdown or sample preparation are required and sample can be placed directly on the microscope stage as they are. Both 3D observation and high precision 3D measurement are possible in real time. With much higher resolution than conventional optical devices but just as many different observation methods, every user can make quicker, more accurate specimen analyses all based on a strict traceability system. Olympus LEXT, as a next generation analysis device, is ideally suited for the ultra-fine surface observation and measurements required for micro fabrication devices like MEMS, for new materials development, and for today’s thinner devices, with more compact surface mounting requirements. |
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